GLITCH DETECTOR IP

 

The Glitch Detector IP is an analog IP aimed at detecting voltage glitches in the power supply of an integrated circuit. Voltage glitches are a common type of fault-injection attacks -also known as perturbation attacks.

 

The Glitch Detector IP has an extremely high sensitivity of up to 10GV/s  while keeping a very low footprint of less than 0.03 mm2 (typical area for a 0.15µm process). 

The Glitch Detector IP is designed to monitor voltages ranging from 1.35 V to 3.0 V. It outputs a 4 bit alarm signal, each bit corresponding to a different slope characteristic as per the table below:

 

Alarm

Max Slope

Alarm <0>

10 GV/s

Alarm <1>

2 GV/s

Alarm <2>

0.5 GV/s

Alarm <3>

0.1 GV/s

 

WHAT's COOLHighlights

  • Detect positive and negative glitches with slopes ranging from 2 MV/s to 10 GV/s
  • Extremely low footprint : less than 0.03 mm2 on 0.15 µm process

Security featuresFeatures

  • Monitor voltage from 1.35V to 3.0V
  • Outputs a 4 bits alarm signal depending on the slope of the glitch detected

LOW POWERPower Consumption

  • 20µA typical (standard 0.15 µm process)
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DELIVERABLESDeliverables

  • Specification and Integration Manual
  • GDSII and Layer Map files
  • Library Exchange Format (LEF) defining size and pin locations
  • RTL Behavioral Model
  • Timing Constraint Files
  • Netlist in SPICE format for LVS

 

The Glitch Detector IP has a strong track record of silicon implementation with volume production in 150nm and 65nm. Test chips and characterization reports of these test chips can be shared under NDA. Please contact sales@invia.fr for more information.

 

The Glitch Detector IP has been integrated in integrated circuits that are certified according to formal security standards such as Common Criteria version 2.3. The specific evaluation level and the evaluation report can also be shared under NDA.  Please contact sales@invia.fr for more information

 

Did you know ?


A fault-injection attack, also known as perturbation attack,  modifies the normal behavior of the circuit in a way that let the attackers derive secret information.  Cryptosystems such as RSA and DES are subject to such attacks. Non Volatile Memories  are also subject to such attacks.

Faults can be injected in the supply voltage (e.g. glitch), in the external clock,  by adjusting the temperature and with laser beam and X-Rays. The first academic paper related to fault-injection attacks on RSA cryptosystems was published in 2001.

 

 

Silicon track record Silicon track record

  • 150 nm
  • 65 nm
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